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CVE PROGRAM SOURCE RECORD8.4 High

CVE-2022-25697

Memory corruption in i2c buses due to improper input validation while reading address configuration from i2c driver in Snapdragon Mobile, Snapdragon Wearables

Description

Memory corruption in i2c buses due to improper input validation while reading address configuration from i2c driver in Snapdragon Mobile, Snapdragon Wearables

Affected products

Version statuses are supplied by the assigning organization. Consult the original record for detailed ranges and platform conditions.

Qualcomm, Inc. Snapdragon Mobile, Snapdragon Wearables

  • SD 8 Gen1 5Gaffected
  • SD429affected
  • SDA429Waffected
  • SDM429Waffected
  • WCD9380affected
  • WCN3610affected
  • WCN3620affected
  • WCN3660Baffected
  • WCN3680Baffected
  • WCN3980affected
  • WCN6855affected
  • WCN6856affected
  • WCN7850affected
  • WCN7851affected
  • WSA8830affected
  • WSA8835affected

References